Buried Bus and Related Method

ABSTRACT

A semiconductor structure includes a semiconductor substrate having a gate electrode in a gate trench, a buried bus in the semiconductor substrate, the buried bus having a bus conductive filler in a bus trench, where the bus conductive filler is electrically coupled to the gate electrode. The bus conductive filler is surrounded by the gate electrode. The gate trench intersects the bus trench in the semiconductor substrate. The gate electrode includes polysilicon. The bus conductive filler includes tungsten. The semiconductor structure also includes an adhesion promotion layer interposed between the bus conductive filler and the gate electrode, where the adhesion promotion layer includes titanium and titanium nitride. The semiconductor structure also includes a dielectric layer covering the gate electrode over the semiconductor substrate, where the buried bus has a coplanar top surface with the dielectric layer.

BACKGROUND

Gate resistance can introduce switching losses that can impact the performance of a semiconductor device, such as a metal oxide semiconductor field effect transistor (MOSFET) or an insulated gate bipolar transistor (IGBT). As increasing power density leads to smaller features in active cells, the gate resistance becomes more pertinent to device performance. In a conventional semiconductor device, gate contacts and source contacts are formed in metal one (M1) layer in a dual metal structure over a semiconductor substrate. The gate and source contacts in the M1 layer need to be effectively isolated to prevent electrical shorts. As the power density increases, it has become increasing difficult to effectively isolate the gate and source contacts. In addition, the dual metal structure requires wirebonds to make electrical connections to the gate and source contacts. Wire bonding over a dual metal structure using the existing art with raised or even planarized and segregated metal buses risks breaking the isolation between gate and source creating a short.

Thus, there is a need in the art for a low-resistance gate structure that can effectively remove the need for a dual metal structure and enable a more robust structure for wire bonding.

SUMMARY

The present disclosure is directed to a buried bus and related method, substantially as shown in and/or described in connection with at least one of the figures, and as set forth in the claims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a flowchart illustrating a method of forming a semiconductor structure having a buried bus according to one implementation of the present application.

FIG. 2A illustrates a top plan view of a portion of a semiconductor structure having a buried bus processed in accordance with an initial action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 2B illustrates a cross-sectional view of a portion of a semiconductor structure having a buried bus processed in accordance with an initial action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 2C illustrates a cross-sectional view of a portion of a semiconductor structure having a buried bus processed in accordance with an initial action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 3A illustrates a top plan view of a portion of a semiconductor structure having a buried bus processed in accordance with an intermediate action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 3B illustrates a cross-sectional view of a portion of a semiconductor structure having a buried bus processed in accordance with an intermediate action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 3C illustrates a cross-sectional view of a portion of a semiconductor structure having a buried bus processed in accordance with an intermediate action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 4A illustrates a top plan view of a portion of a semiconductor structure having a buried bus processed in accordance with an intermediate action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 4B illustrates a cross-sectional view of a portion of a semiconductor structure having a buried bus processed in accordance with an intermediate action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 4C illustrates a cross-sectional view of a portion of a semiconductor structure having a buried bus processed in accordance with an intermediate action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 5A illustrates a top plan view of a portion of a semiconductor structure having a buried bus processed in accordance with an intermediate action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 5B illustrates a cross-sectional view of a portion of a semiconductor structure having a buried bus processed in accordance with an intermediate action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 5C illustrates a cross-sectional view of a portion of a semiconductor structure having a buried bus processed in accordance with an intermediate action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 6A illustrates a top plan view of a portion of a semiconductor structure having a buried bus processed in accordance with a final action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 6B illustrates a cross-sectional view of a portion of a semiconductor structure having a buried bus processed in accordance with a final action in the flowchart of FIG. 1 according to one implementation of the present application.

FIG. 6C illustrates a cross-sectional view of a portion of a semiconductor structure having a buried bus processed in accordance with a final action in the flowchart of FIG. 1 according to one implementation of the present application.

DETAILED DESCRIPTION

The following description contains specific information pertaining to implementations in the present disclosure. The drawings in the present application and their accompanying detailed description are directed to merely exemplary implementations. Unless noted otherwise, like or corresponding elements among the figures may be indicated by like or corresponding reference numerals. Moreover, the drawings and illustrations in the present application are generally not to scale, and are not intended to correspond to actual relative dimensions.

FIG. 1 shows a flowchart illustrating a method of forming a semiconductor structure having a buried bus according to implementations of the present application. Certain details and features have been left out of flowchart 100 that are apparent to a person of ordinary skill in the art. For example, an action may consist of one or more subactions or may involve specialized equipment or materials, as known in the art. Actions 180, 182, 184, 186 and 188 indicated in flowchart 100 are sufficient to describe one implementation of the present inventive concepts. Other implementations of the present inventive concepts may utilize actions different from those shown in flowchart 100.

In FIGS. 2A, 2B, 2C, 3A, 3B, 3C, 4A, 4B, 4C, 5A, 5B, 5C, 6A, 6B and 6C, respective semiconductor structures 280 a, 280 b, 280 c, 382 a, 382 b, 382 c, 484 a, 484 b, 484 c, 586 a, 586 b, 586 c, 688 a, 688 b and 688 c illustrate the results of performing actions 180, 182, 184, 186 and 188 of flowchart 100, respectively. For example, semiconductor structures 280 a, 280 b and 280 c show exemplary semiconductor structures after the processing of action 180, semiconductor structures 382 a, 382 b and 382 c show exemplary semiconductor structures after the processing of action 182, semiconductor structures 484 a, 484 b and 484 c show exemplary semiconductor structures after the processing of action 184, and so forth.

Referring to action 180 in FIG. 1 and semiconductor structures 280 a, 280 b and 280 c (collectively referred to as “semiconductor structure 280”) in respective FIGS. 2A, 2B and 2C, action 180 includes forming a gate trench and a bus trench in a semiconductor substrate. Referring to FIG. 2A, semiconductor structure 280 a illustrates a top plan view of a portion of a semiconductor structure having a buried bus after completion of action 180 in flowchart 100 of FIG. 1, according to one implementation of the present disclosure. FIG. 2B illustrates a cross-sectional view of exemplary semiconductor structure 280 a in FIG. 2A along line B-B, according to one implementation of the present application. FIG. 2C illustrates a cross-sectional view of exemplary semiconductor structure 280 a in FIG. 2A along line C-C, according to one implementation of the present application.

As illustrated in FIG. 2A, semiconductor structure 280 a includes gate trenches 204 a, 204 b, 204 c, 204 d, 204 e, 204 f and 204 g (collectively referred to “gate trenches 204 a-204 g”) in semiconductor substrate 202. Semiconductor structure 280 a also includes bus trenches 206 a, 206 b and 206 c (collectively referred to “bus trenches 206 a-206 c”) in semiconductor substrate 202. As illustrated in FIG. 2A, gate trenches 204 a-204 g are substantially parallel to one another. Bus trenches 206 a-206 c are substantially parallel to one another, and intersect gate trenches 204 a-204 g.

In the present implementation, semiconductor substrate 202 includes any suitable semiconductor material, such as silicon. In an implementation, semiconductor substrate 202 may include one or more layers of semiconductor material. For example, semiconductor substrate 202 may include a drain region (not explicitly shown in FIGS. 2A-2C) of a first conductivity type (e.g., N+ type), as a drain of a semiconductor device, such as a MOSFET. Semiconductor substrate 202 may include a drift region (not explicitly shown in FIGS. 2A-2C) of the first conductivity type (e.g., N− type) over the drain region. Semiconductor substrate 202 may also include a body region (not explicitly shown in FIGS. 2A-2C) of a second conductivity (e.g., P type) over the drift region. In one implementation, the drain region and the drift region may include N type dopant, such as Phosphorus or Arsenic, while the body region may include P type dopant, such as Boron. In another implementation, the drain region and the drift region may include P type dopant, while the body region may include N type dopant.

In the present implementation, gate trenches 204 a-204 g and bus trenches 206 a-206 c are formed in a single processing action by etching semiconductor substrate 202 using a patterned photoresist layer (not explicitly shown in FIGS. 2A-2C). For example, reactive ion etching (RIE) or other suitable etching methods may be used to form gate trenches 204 a-204 g and bus trenches 206 a-206 c. In another implementation, gate trenches 204 a-204 g and bus trenches 206 a-206 c may be formed in separate processing actions. A residue clean may be performed to remove residues, impurities and other unwanted material from gate trenches 204 a-204 g and bus trenches 206 a-206 c in semiconductor structure 280.

As illustrated in FIG. 2B, bus trenches 206 b and 206 c (as well as bus trench 206 a in FIG. 2A) each include substantially parallel sidewalls extending into a U-shaped bottom. In another implementation, bus trenches 206 a-206 c may each include sloped sidewalls and/or a flat bottom. As illustrated in FIG. 2C, gate trenches 204 a, 204 b, 204 c and 204 d (as well as gate trenches 204 e, 204 f and 204 g in FIG. 2A) each include substantially parallel sidewalls extending into a U-shaped bottom. In another implementation, gate trenches 204 a-204 g may each include sloped sidewalls and/or a flat bottom.

As illustrated in FIGS. 2A-2C, each of bus trenches 206 a-206 c has a width that is greater than a width of each of gate trenches 204 a-204 g. In the present implementation, bus trenches 206 a-206 c have a substantially uniform depth, that is slightly greater (e.g., 10-15%) than a depth of each of gate trenches 204 a-204 g. For example, gate trenches 204 a-204 g and bus trenches 206 a-206 c may extend through the body region into the drift region of semiconductor substrate 202. In another implementation, bus trenches 206 a-206 c may have the same width and/or depth as gate trenches 204 a-204 g. In other implementations, gate trenches 204 a-204 g and bus trenches 206 a-206 c may have any appropriate width and depth to suit the specific needs of a particular application.

As illustrated in FIGS. 2A and 2B, each of bus trenches 206 a-206 c is connected to each of gate trenches 204 a-204 g. For example, bus trench 206 a is connected to each of gate trenches 204 a-204 g on one end of the gate trenches, while bus trench 206 c is connected to each of gate trenches 204 a-204 g on another end of the gate trenches. Also, bus trench 206 b is connected to and intersecting each of gate trenches 204 a-204 g at approximately the mid point of each of the gate trenches.

Referring to action 182 in FIG. 1 and semiconductor structures 382 a, 382 b and 382 c (collectively referred to as “semiconductor structure 382”) in respective FIGS. 3A, 3B and 3C, action 182 includes forming a dielectric liner in the gate trench and the bus trench, forming a gate electrode over the dielectric liner, and forming a dielectric layer over the semiconductor substrate. Referring to FIG. 3A, semiconductor structure 382 a illustrates a top plan view of a portion of a semiconductor structure having a buried bus after completion of action 182 in flowchart 100 of FIG. 1, according to one implementation of the present disclosure. FIG. 3B illustrates a cross-sectional view of exemplary semiconductor structure 382 a in FIG. 3A along line B-B, according to one implementation of the present application. FIG. 2C illustrates a cross-sectional view of exemplary semiconductor structure 382 a in FIG. 2A along line C-C, according to one implementation of the present application. With similar numerals representing similar features in FIGS. 2A-2C, in FIG. 3A, semiconductor structure 382 a includes gate trenches 304 a, 304 b, 304 c, 304 d, 304 e, 304 f and 304 g (collectively referred to “gate trenches 304 a-304 g”) and bus trenches 306 a, 306 b and 306 c (collectively referred to “bus trenches 306 a-306 c”) in semiconductor substrate 302. As illustrated in FIG. 3A, semiconductor structure 382 a includes dielectric liner 308 and gate electrode 310 over dielectric liner 308 in gate trenches 304 a-304 g and bus trenches 306 a-306 c. Dielectric layer 312, which is rendered transparent in FIG. 3A for clarity, is a blanket dielectric layer over semiconductor substrate 302 and covers gate trenches 304 a-304 g and bus trenches 306 a-306 c.

As illustrated in FIGS. 3A-3C, dielectric liner 308 lines the sidewalls and the bottom of each of gate trenches 304 a-304 g and bus trenches 306 a-306 c. For example, dielectric liner 308 may be formed by depositing and/or thermally growing a dielectric material in gate trenches 304 a-304 g and bus trenches 306 a-306 c. In the present implementation, dielectric liner 308 includes silicon dioxide. In another implementation, dielectric liner 308 may include other suitable dielectric material, such as a nitride material (e.g., silicon nitride) or tetraethylorthosilicate (TEOS).

As illustrated in FIGS. 3A-3C, gate electrode 310 is formed over dielectric liner 308 in each of gate trenches 304 a-304 g and bus trenches 306 a-306 c. For example, gate electrode 310 may be formed by depositing a conductive material over dielectric liner 308 in gate trenches 304 a-304 g and bus trenches 306 a-306 c such that gate electrode 310 in each of gate trenches 304 a-304 g are interconnected with gate electrode 310 in each of bus trenches 306 a-306 c. In the present implementation, gate electrode 310 includes polycrystalline silicon. In another implementation, gate electrode 310 may include other suitable conductive material, such as metals or metal alloys.

As illustrated in FIGS. 3A-3C, dielectric layer 312 is formed over semiconductor substrate 302 and covers dielectric liner 308 and gate electrode 310 in gate trenches 304 a-304 g and bus trenches 306 a-306 c. For example, dielectric layer 312 may be formed by depositing and/or thermally growing a dielectric layer over semiconductor substrate 302. In the present implementation, dielectric layer 312 includes silicon dioxide. In another implementation, dielectric layer 312 may include other suitable dielectric material, such as a nitride material (e.g., silicon nitride) or tetraethylorthosilicate (TEOS).

It should be understood that after the formations of dielectric liner 308 and gate electrode 310, a planarization process, such as Chemical Mechanical Polishing (CMP), may be performed to planarize dielectric liner 308 and gate electrode 310 with semiconductor substrate 302 before the formation of dielectric layer 312.

Referring to action 184 in FIG. 1 and semiconductor structures 484 a, 484 b and 484 c (collectively referred to as “semiconductor structure 484”) in respective FIGS. 4A, 4B and 4C, action 184 includes forming an opening in the gate electrode in the bus trench. Referring to FIG. 4A, semiconductor structure 484 a illustrates a top plan view of a portion of a semiconductor structure having a buried bus after completion of action 184 in flowchart 100 of FIG. 1, according to one implementation of the present disclosure. FIG. 4B illustrates a cross-sectional view of exemplary semiconductor structure 484 a in FIG. 4A along line B-B, according to one implementation of the present application. FIG. 4C illustrates a cross-sectional view of exemplary semiconductor structure 484 a in FIG. 4A along line C-C, according to one implementation of the present application.

With similar numerals representing similar features in FIGS. 3A-3C, in FIG. 4A, semiconductor structure 484 a includes gate trenches 404 a, 404 b, 404 c, 404 d, 404 e, 404 f and 404 g (collectively referred to “gate trenches 404 a-404 g”) and bus trenches 406 a, 406 b and 406 c (collectively referred to “bus trenches 406 a-406 c”) in semiconductor substrate 402. As illustrated in FIG. 4A, semiconductor structure 484 a includes dielectric liner 408 and gate electrode 410 over dielectric liner 408 in gate trenches 404 a-404 g and bus trenches 406 a-406 c. Dielectric layer 412 and photoresist layer 414, which are rendered transparent in FIG. 4A for clarity, are over semiconductor substrate 402 and covers gate trenches 404 a-404 g and portions of bus trenches 406 a-406 c. Semiconductor structure 484 a also includes openings 416 a, 416 b and 416 c (collectively referred to “openings 416 a-416 c”) formed in gate electrode 410 in respective bus trenches 406 a, 406 b and 406 c.

As illustrated in FIGS. 4A and 4B, photoresist layer 414 is formed and patterned over dielectric layer 412. Openings 416 a-416 c are formed by removing portions of dielectric layer 412 and gate electrode 410 in bus trenches 406 a-406 c, respectively, for example, by RIE or other suitable etching methods. As illustrated in FIG. 4B, openings 416 b and 416 c (as well as opening 416 a in FIG. 4A) extend through photoresist layer 414 and dielectric layer 412 into gate electrode 410. It should be noted that each of openings 416 a-416 c terminates within gate electrode 410, such that gate electrode 410 remains on the sidewalls and the bottom of each of bus trenches 406 a-406 c. Since openings 416 a-416 c do not extend through the entire thickness of gate electrode 410 in respective bus trenches 406 a-406 c, dielectric liner 408 at the bottom of each of bus trenches 406 a-406 c is not damaged during the formation of openings 416 a-416 c. As can be seen in FIG. 4C, dielectric liner 408 and gate electrode 410 in gate trenches 404 a, 404 b, 404 c and 404 d (as well as gate trenches 404 e, 404 f and 404 g in FIG. 4A) remain covered by dielectric layer 412 during action 184 of flowchart 100.

Referring to action 186 in FIG. 1 and semiconductor structures 586 a, 586 b and 586 c (collectively referred to as “semiconductor structure 586”) in respective FIGS. 5A, 5B and 5C, action 186 includes forming an adhesion promotion layer in the opening, and forming a bus conductive filler in the opening. Referring to FIG. 5A, semiconductor structure 586 a illustrates a top plan view of a portion of a semiconductor structure having a buried bus after completion of action 186 in flowchart 100 of FIG. 1, according to one implementation of the present disclosure. FIG. 5B illustrates a cross-sectional view of exemplary semiconductor structure 586 a in FIG. 5A along line B-B, according to one implementation of the present application. FIG. 5C illustrates a cross-sectional view of exemplary semiconductor structure 586 a in FIG. 5A along line C-C, according to one implementation of the present application.

With similar numerals representing similar features in FIGS. 4A-4C, in FIG. 5A, semiconductor structure 586 a includes gate trenches 504 a, 504 b, 504 c, 504 d, 504 e, 504 f and 504 g (collectively referred to “gate trenches 504 a-504 g”) and bus trenches 506 a, 506 b and 506 c (collectively referred to “bus trenches 506 a-506 c”) in semiconductor substrate 502. As illustrated in FIG. 5A, semiconductor structure 586 a includes dielectric liner 508 and gate electrode 510 over dielectric liner 508 in gate trenches 504 a-504 g and bus trenches 506 a-506 c. Dielectric layer 512, which is rendered transparent in FIG. 5A for clarity, is over semiconductor substrate 502. Adhesion promotion (AP) layer 518 and bus conductive filler 520, which are rendered transparent in FIG. 5A for clarity, are formed in openings 516 a, 516 b and 516 c (collectively referred to “openings 516 a-516 c”) and over dielectric layer 512.

In the present implementation, after photoresist layer 414 is removed from semiconductor structure 484 in FIGS. 4A-4C, AP layer 518 is formed in openings 516 a-516 c and over dielectric layer 512 before the formation of bus conductive filler 520 to improve adhesion between gate electrode 510 and bus conductive filler 520. In the present implementation, AP layer 518 includes titanium and titanium nitride. In other implementations, AP layer 518 may include other suitable conductive material for promoting adhesion between gate electrode 510 and bus conductive filler 520 in each of bus trenches 506 a-506 c. In another implementation, AP layer 518 may be optionally omitted. In the present implementation, bus conductive filler 520 is formed over AP layer 518 in openings 516 a, 516 b and 516 c and over dielectric layer 512. For example, bus conductive filler 520 may be formed over AP layer 518 using physical vapor deposition (PVD), chemical vapor deposition (CVD), plasma enhanced chemical vapor deposition (PECVD), thermal CVD, or spin-coating. In the present implementation, bus conductive filler 520 includes a conductive material having a low resistance and a high melting point, such as tungsten. In other implementations, bus conductive filler 520 may include other suitable conductive material. As illustrated in FIG. 5B, bus conductive filler 520 is surrounded by and electrically connected to gate electrode 510 in each of bus trenches 506 b and 506 c (as well as bus trench 506 a in FIG. 5A). As can be seen in FIG. 5C, AP layer 518 and bus conductive filler 520 are also formed over dielectric liner 508 and gate electrode 510 in gate trenches 504 a, 504 b, 504 c and 504 d (as well as gate trenches 504 e, 504 f and 504 g in FIG. 5A), which are covered by dielectric layer 512 during action 186 of flowchart 100.

Referring to action 188 in FIG. 1 and semiconductor structures 688 a, 688 b and 688 c (collectively referred to as “semiconductor structure 688”) in respective FIGS. 6A, 6B and 6C, action 188 includes planarizing the adhesion promotion layer and the bus conductive filler with the dielectric layer to form a buried bus. Referring to FIG. 6A, semiconductor structure 688 a illustrates a top plan view of a portion of a semiconductor structure having a buried bus after completion of action 188 in flowchart 100 of FIG. 1, according to one implementation of the present disclosure. FIG. 6B illustrates a cross- sectional view of exemplary semiconductor structure 688 a in FIG. 6A along line B-B, according to one implementation of the present application. FIG. 6C illustrates a cross- sectional view of exemplary semiconductor structure 688 a in FIG. 6A along line C-C, according to one implementation of the present application.

With similar numerals representing similar features in FIGS. 5A-5C, in Figures is 6A-6C, semiconductor structure 688 includes gate trenches 604 a, 604 b, 604 c and 604 d (collectively referred to “gate trenches 604 a-604 d”) and bus trenches 606 a, 606 b and 606 c (collectively referred to “bus trenches 606 a-606 c”) in semiconductor substrate 602. It should be understood that semiconductor structure 688 may also include other gate trenches (not explicitly shown in FIGS. 6A-6C), such as gate trenches 504 e, 504 f and 504 g in FIG. 5A, under dielectric layer 612. Semiconductor structure 688 includes dielectric liner 608 and gate electrode 610 over dielectric liner 608 in gate trenches 604 a-604 d and bus trenches 606 a-606 c. Buried buses 622 a, 622 b and 622 c (collectively referred to “buried buses 622 a-622 c”) are formed in semiconductor substrate 602 and have a coplanar top surface with dielectric layer 612. For example, buried bus 622 a includes conductive filler 620 a and AP layer 618 a, which are surrounded by gate electrode 610 in bus trench 606 a. Similarly, buried buses 622 b and 622 c include conductive fillers 620 b and 620 c, and AP layers 618 b and 618 c, respectively, which are surrounded by gate electrode 610 in respective bus trenches 606 b and 606 c.

As illustrated in FIGS. 6A-6C, the excess bus conductive filler and AP layer (e.g., bus conductive filler 520 and AP layer 518 in FIGS. 5A-5C) over dielectric layer 612 are removed from semiconductor structure 688 by using, for example, CMP. As such, AP layers 618 a, 618 b, and 618 c, and bus conductive fillers 620 a, 620 b and 620 c in respective bus trenches 606 a, 606 b and 606 c have a coplanar top surface with dielectric layer 612, as shown in FIGS. 6A-6C. As illustrated in FIG. 6B, each of buried buses 622 b and 622 c (as well as buried bus 622 a in FIG. 6A) is surrounded by and electrically connected to gate electrode 610 in each of bus trenches 606 a-606 c.

In the present implementation, gate electrode 610 in gate trenches 604 a-604 d (as well as in other gate trenches under dielectric layer 612) and buried buses 622 a-622 c in semiconductor structure 688 may be a gate structure of a substantially vertical conduction semiconductor device, such as a MOSFET, a bipolar junction transistor (BJT) or an insulated gate bipolar transistor (IGBT). It should be understood that a source and a drain region (not explicitly shown in FIGS. 6A-6C) may be formed on the respective top and bottom sides of semiconductor substrate 602, thus forming a substantially vertical conduction power semiconductor device. In an other implementation, gate electrode 610 in gate trenches 604 a-604 d (as well as in other gate trenches under dielectric layer 612) and buried buses 622 a-622 c in semiconductor structure 688 may be a gate structure for any type of semiconductor device, in which the gate is buried into the semiconductor substrate, including substantially lateral conduction semiconductor devices. In the present implementation, since gate electrode 610 in gate trenches 604 a-604 d makes electrical and mechanical contact with buried buses 622 a-622 c in bus trenches 606 a-606 c, respectively, gate electrode 610 and buried buses 622 a-622 c may only require one or a few gate pads on a subsequently formed metal one (M1) layer over dielectric layer 612 for gate connection. As a result, source contacts may be formed in the M1 layer without requiring a complex dual metal structure. Since the M1 layer may only contain one or a few gate pads, effective electrical isolation between the gate pads and the source contacts can be achieved. In addition, gate electrode 610 and buried buses 622 a-622 c may also enable a more robust structure for wire bonding in the M1 layer.

From the above description it is manifest that various techniques can be used for implementing the concepts described in the present application without departing from the scope of those concepts. Moreover, while the concepts have been described with specific reference to certain implementations, a person of ordinary skill in the art would recognize that changes can be made in form and detail without departing from the scope of those concepts. As such, the described implementations are to be considered in all respects as illustrative and not restrictive. It should also be understood that the present application is not limited to the particular implementations described above, but many rearrangements, modifications, and substitutions are possible without departing from the scope of the present disclosure. 

1. A semiconductor structure, comprising: a semiconductor substrate having a gate electrode in a gate trench; a buried bus in said semiconductor substrate, said buried bus having a bus conductive filler in a bus trench; and an adhesion promotion layer in said bus trench and interposed between said bus conductive filler and said gate electrode, wherein said bus conductive filler is electrically coupled to said gate electrode.
 2. The semiconductor structure of claim 1, wherein said bus conductive filler is surrounded by said gate electrode.
 3. The semiconductor structure of claim 1, wherein said gate trench intersects said bus trench in said semiconductor substrate.
 4. The semiconductor structure of claim 1, wherein said gate electrode comprises polysilicon.
 5. The semiconductor structure of claim 1, wherein said bus conductive filler comprises tungsten.
 6. (canceled)
 7. The semiconductor structure of claim 1, wherein said adhesion promotion layer comprises titanium and titanium nitride.
 8. The semiconductor structure of claim 1, further comprising a dielectric liner in said gate trench and said bus trench.
 9. The semiconductor structure of claim 1, further comprising a dielectric layer covering said gate electrode over said semiconductor substrate.
 10. The semiconductor structure of claim 9, wherein said buried bus has a coplanar top surface with said dielectric layer.
 11. A method of forming a semiconductor structure, said method comprising: forming a gate trench and a bus trench in a semiconductor substrate, said gate trench connected to said bus trench; forming a gate electrode in said gate trench and said bus trench; forming an opening in said gate electrode in said bus trench; forming a bus conductive filler in said opening, thereby forming a buried bus; and forming an adhesion promotion layer in said bus trench and interposed between said bus conductive filler and said gate electrode, wherein said bus conductive filler is electrically coupled to said gate electrode.
 12. The method of claim 11, further comprising forming a dielectric liner in said gate trench and said bus trench.
 13. The method of claim 11, further wherein said bus conductive filler is surrounded by said gate electrode.
 14. The method of claim 11, further comprising forming a dielectric layer over said semiconductor substrate.
 15. The method of claim 14, further comprising planarizing said bus conductive filler such that said bus conductive filler having a coplanar top surface with said dielectric layer.
 16. The method of claim 11, wherein said gate electrode comprises polysilicon.
 17. The method of claim 11, wherein said bus conductive filler comprises tungsten.
 18. (canceled)
 19. The method of claim 11, wherein said adhesion promotion layer comprises titanium and titanium nitride.
 20. The method of claim 11, wherein said bus trench has a width that is greater than that of said gate trench.
 21. The semiconductor structure of claim 1, wherein said bus conductive filler comprises a different material than said gate electrode.
 22. A semiconductor structure, comprising: a semiconductor substrate having a gate electrode in a gate trench; a buried bus in said semiconductor substrate, said buried bus having a bus conductive filler in a bus trench; and a dielectric layer over and in contact with said semiconductor substrate, wherein said gate electrode extends to and terminates at a first surface of said dielectric layer, said first surface facing said semiconductor substrate, wherein said bus conductive filler extends to and terminates at a second surface of said dielectric layer opposite said first surface, wherein said gate trench runs perpendicular to said bus trench, wherein said bus conductive filler is electrically coupled to said gate electrode. 